Developments in synchrotron x-ray micro-tomography for in-situ materials analysis at the Advanced Light Source

Harold S. Barnard; A. A. MacDowell; D. Y. Parkinson; S. V. Venkatakrishnan; F. Panerai; N. N. Mansour

doi:10.1117/12.2238305

3 October 2016 Developments in synchrotron x-ray micro-tomography for in-situ materials analysis at the Advanced Light Source

Harold S. Barnard, A. A. MacDowell, D. Y. Parkinson, S. V. Venkatakrishnan, F. Panerai, N. N. Mansour

Author Affiliations +

Proceedings Volume 9967, Developments in X-Ray Tomography X; 99671H (2016) https://doi.org/10.1117/12.2238305
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

The Advanced Light Source (ALS) is a third-generation synchrotron X-ray source that operates as a user facility with more than 40 beamlines hosting over 2000 users per year. Synchrotron sources like the ALS provide high quality X-ray beams, with flux that is several orders of magnitude higher than lab-based sources. This is particularly advantageous for dynamic applications because it allows for high-speed, high-resolution imaging and microscale tomography. The hard X-ray beamline 8.3.2 at the Advanced Light Source enables imaging of samples at high temperatures and pressures, with mechanical loading and other realistic conditions using environmental test cells. These test cells enable experimental observation of samples undergoing dynamic microstructural changes in-situ. We present recent instrumentation developments that allow for continuous tomography with scan rates approaching 1 Hz per 3D image. In addition, our use of iterative reconstruction techniques allows for improved image quality despite fewer images and low exposure times used during fast tomography compared to traditional Fourier reconstruction methods.

Citation Download Citation

Harold S. Barnard, A. A. MacDowell, D. Y. Parkinson, S. V. Venkatakrishnan, F. Panerai, and N. N. Mansour "Developments in synchrotron x-ray micro-tomography for in-situ materials analysis at the Advanced Light Source", Proc. SPIE 9967, Developments in X-Ray Tomography X, 99671H (3 October 2016); https://doi.org/10.1117/12.2238305

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available