PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
We investigate the possibility of probing the electrical status of a p-i-n junction via an optical fiber, without the need for electrical contacts. A photonic crystal with a resonance in the near-infrared is etched in a thin membrane of III-V semiconductor with an embedded p-i-n junction and placed on the cleaved facet of a fiber. We measure the effect of photoexcited carriers on the built-in voltage of the diode through the Pockels effect. This may enable the all-optical read-out of electrical signals from sensors in a distant or inaccessible environment.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Luca Picelli, René P. J. van Veldhoven, Ewold Verhagen, Andrea Fiore, "All-optical probing of a semiconductor photodiode," Proc. SPIE PC11995, Physics and Simulation of Optoelectronic Devices XXX, PC1199509 (1 April 2022); https://doi.org/10.1117/12.2607209