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This study explores Atomic Force Microscopy's (AFM) applicability for 3D analysis by determining its "mechanical focal plane" in soft composites. The investigators determined the AFM's ability to measure mechanics from a distance when target components are immersed in a secondary medium. Using the Kelvin-Voigt model under quasi-static and dynamic conditions, a sample material with polystyrene beads embedded in agarose gel is analyzed at varying scanning parameters. The results include a model of the effective depth and the effect that a secondary medium has on the ability to measure an embedded component's properties.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Adam T. Baker, Bruce Z. Gao, Reece Fratus, Delphine Dean, Tong Ye, Farhad Shokati, "Modeling the mechanical focal plane of atomic force microscopy," Proc. SPIE PC12844, Optical Elastography and Tissue Biomechanics XI, PC128440X (13 March 2024); https://doi.org/10.1117/12.3003157