EQE measurement technique for multi-junction photovoltaics with overlapping subcell absorptance

Meghan N. Beattie; Michael Schachtner; Karin Hinzer; David Lackner; Oliver Höhn; Gerald Siefer; Henning Helmers

doi:10.1117/12.3001662

9 March 2024 EQE measurement technique for multi-junction photovoltaics with overlapping subcell absorptance

Meghan N. Beattie, Michael Schachtner, Karin Hinzer, David Lackner, Oliver Höhn, Gerald Siefer, Henning Helmers

Proceedings Volume PC12881, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices XIII; PC1288107 (2024) https://doi.org/10.1117/12.3001662
Event: SPIE OPTO, 2024, San Francisco, California, United States

Abstract

The standard method to measure subcell external quantum efficiency (EQE) for multi-junction photovoltaics (MJPV) uses light biasing to bring each subcell into current limitation. This method is suitable when each subcell absorbs in a different wavelength range. However, isolating individual subcells via light biasing is difficult for semitransparent subcells with overlapping absorptance, as in MJPV designed for monochromatic irradiance in power-by-light systems. For these cells, the standard measurement approach falls short. Here, we present an alternative technique that incorporates a negative bias voltage to overcome this limitation. We demonstrate subcell EQE measurements in MJPV devices with up to six GaAs subcells.

Conference Presentation

Citation Download Citation

Meghan N. Beattie, Michael Schachtner, Karin Hinzer, David Lackner, Oliver Höhn, Gerald Siefer, and Henning Helmers "EQE measurement technique for multi-junction photovoltaics with overlapping subcell absorptance", Proc. SPIE PC12881, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices XIII, PC1288107 (9 March 2024); https://doi.org/10.1117/12.3001662

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