Presentation
13 March 2024 Imaging through fog using silicon-integrated GeSn PIN extended-SWIR photodetectors
Author Affiliations +
Proceedings Volume PC12891, Silicon Photonics XIX; PC128910I (2024) https://doi.org/10.1117/12.3003906
Event: SPIE OPTO, 2024, San Francisco, California, United States
Abstract
Optoelectronic devices operating in the extended short-wave infrared (e-SWIR) covering the 1.4-3.0 μm wavelength range provide valuable information that can not be gathered in the visible wavelengths. For instance, e-SWIR penetrates fog, haze, and smog. The current e-SWIR technologies utilize predominantly expensive III-V and II-VI semiconductors, hindering the large-scale use of e-SWIR devices. Herein, we introduce GeSn devices monolithically integrated on Si wafers as a low-cost, scalable, and CMOS-compatible e-SWIR technology. E-SWIR imaging through fog is demonstrated utilizing the grown GeSn PIN photodetectors. To record the images, focused light from a broadband source was directed through a silicon (Si) wafer and an artificial fog toward the GeSn photodetector. Using raster scanning and a single GeSn photodiode epitaxially grown on Si wafer, full images were composed. The latter showed a clear contrast between the illuminated and the dark zones. This capacity to properly detect objects through obscurants opens a range of opportunities for real-life applications in e-SWIR imaging.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nathalie Rojas-Lobo, Mahmoud R. M. Atalla, Cédric Lemieux-Leduc, and Oussama Moutanabbir "Imaging through fog using silicon-integrated GeSn PIN extended-SWIR photodetectors", Proc. SPIE PC12891, Silicon Photonics XIX, PC128910I (13 March 2024); https://doi.org/10.1117/12.3003906
Advertisement
Advertisement
KEYWORDS
Silicon

Fiber optic gyroscopes

Photodetectors

Semiconducting wafers

Imaging systems

Infrared imaging

Infrared radiation

RELATED CONTENT


Back to Top