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18 June 2024 Terahertz assisted atom probe tomography: effect of single-cycle THz pulses on ion dynamics
Angela Vella, Michella Karam, Jonathan Houard, Matteo De Tullio
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Proceedings Volume PC12994, Terahertz Photonics III; PC129940I (2024) https://doi.org/10.1117/12.3017117
Event: SPIE Photonics Europe, 2024, Strasbourg, France
Abstract
We present the application of THz monocycles to the Atom Probe Tomography (APT), an analytical microscope that allows the three-dimensional mapping of chemical heterogeneities in a material at the atomic scale. When a positive electric field of several volts per angstrom is applied to the surface of a material, the surface atoms evaporate as ions even at cryogenic temperatures, this is the work principle of APT. We prove that THz transient can induce the controlled evaporation of surface atoms due to the strong increase in the THz field in the near field of the sample. In addition, the use of THz pulses reduces the thermal effects reported when using laser pulses in the visible or near ultraviolet domain. We are also studying the effect of the THz pulses on the energy of the evaporated ions.
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Angela Vella, Michella Karam, Jonathan Houard, and Matteo De Tullio "Terahertz assisted atom probe tomography: effect of single-cycle THz pulses on ion dynamics", Proc. SPIE PC12994, Terahertz Photonics III, PC129940I (18 June 2024); https://doi.org/10.1117/12.3017117
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KEYWORDS
Terahertz radiation
Chemical species
Ions
Tomography
Electric fields
Silica
Silicon
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