From scattering regime to strong localization: a statistical analysis of the near-field intensity on random gold films

Julien Laverdant; Jean-Pierre Hermier; Xavier Quelin; Stephanie Buil

doi:10.1117/1.JNP.7.073589

8 August 2013 From scattering regime to strong localization: a statistical analysis of the near-field intensity on random gold films

Julien Laverdant, Jean-Pierre Hermier, Xavier Quelin, Stephanie Buil

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Journal of Nanophotonics, Vol. 7, Issue 1, 073589 (August 2013). https://doi.org/10.1117/1.JNP.7.073589

Abstract

Random metallic films have very specific optical properties due to disorder. Strong localization of electromagnetic fields can be observed due to plasmons. This localization strongly depends on excitation conditions, and different optical regimes can exist. To characterize these regimes, we investigated the spatial intensity correlation functions using near-field scanning optical microscopy for different excitation wavelengths and different incident polarization states. The transition between a weak scattering regime where no plasmon resonances are excited and a regime where strong plasmon resonances occur has clearly been observed. In the strong plasmonic regime, by varying the incident polarization direction, the shape of the correlation function has been correlated to the intensity enhancement which raises the possibility to control the intensity localization using the incident polarization state.

CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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Julien Laverdant, Jean-Pierre Hermier, Xavier Quelin, and Stephanie Buil "From scattering regime to strong localization: a statistical analysis of the near-field intensity on random gold films," Journal of Nanophotonics 7(1), 073589 (8 August 2013). https://doi.org/10.1117/1.JNP.7.073589

Published: 8 August 2013

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