Phase-shifting photoelasticity using a flatbed scanner

T. W. Ng; P.K. Quek; K.H. Lim

doi:10.1117/1.1589025

1 August 2003 Phase-shifting photoelasticity using a flatbed scanner

T. W. Ng, P.K. Quek, K.H. Lim

Optical Engineering, Vol. 42, Issue 8, (August 2003). https://doi.org/10.1117/1.1589025

We investigate the use of flatbed scanners for photoelasticity. It is found that performing phase shift on red, green, and blue component images extracted from fringe images scanned in white light can produce whole-field phase maps, though low levels of error can only be achieved using red and green component images. Results from a circular photoelastic disk subjected to direct compressive loading show close correspondence with the results from theoretical calculations. The adaptation of photoelasticity into flatbed scanners will yield systems that are simple, cost effective, and compact. These features and the demonstrated ability for automatic analysis using phase shifting should encourage a greater adoption of photoelasticity in the industry.

©(2003) Society of Photo-Optical Instrumentation Engineers (SPIE)

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T. W. Ng, P.K. Quek, and K.H. Lim "Phase-shifting photoelasticity using a flatbed scanner," Optical Engineering 42(8), (1 August 2003). https://doi.org/10.1117/1.1589025

Published: 1 August 2003

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