Radiometric characterization of long-wavelength infrared type II strained layer superlattice focal plane array under low-photon irradiance conditions

John E. Hubbs; Vaidya Nathan; Meimei Z. Tidrow; Manijeh Razeghi

doi:10.1117/1.OE.51.6.064002

8 June 2012 Radiometric characterization of long-wavelength infrared type II strained layer superlattice focal plane array under low-photon irradiance conditions

John E. Hubbs, Vaidya Nathan, Meimei Z. Tidrow, Manijeh Razeghi

Author Affiliations +

Optical Engineering, Vol. 51, Issue 6, 064002 (June 2012). https://doi.org/10.1117/1.OE.51.6.064002

Abstract

We present the results of the radiometric characterization of an "M" structure long wavelength infrared Type-II strained layer superlattice (SLS) infrared focal plane array (IRFPA) developed by Northwestern University (NWU). The performance of the M-structure SLS IRFPA was radiometrically characterized as a function of photon irradiance, integration time, operating temperature, and detector bias. Its performance is described using standard figures of merit: responsivity, noise, and noise equivalent irradiance. Assuming background limited performance operation at higher irradiances, the detector quantum efficiency for the SLS detector array is approximately 57%. The detector dark density at 80 K is 142 μA/cm², which represents a factor of seven reduction from previously measured devices.

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John E. Hubbs, Vaidya Nathan, Meimei Z. Tidrow, and Manijeh Razeghi "Radiometric characterization of long-wavelength infrared type II strained layer superlattice focal plane array under low-photon irradiance conditions," Optical Engineering 51(6), 064002 (8 June 2012). https://doi.org/10.1117/1.OE.51.6.064002

Published: 8 June 2012

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