Vision system for surface roughness and surface defect measurement

Ruipeng Guo; Dongliang Bian

doi:10.1117/1.OE.58.6.064103

13 June 2019 Vision system for surface roughness and surface defect measurement

Ruipeng Guo, Dongliang Bian

Author Affiliations +

Optical Engineering, Vol. 58, Issue 6, 064103 (June 2019). https://doi.org/10.1117/1.OE.58.6.064103

Abstract

A vision system for surface roughness and surface defect measurement is introduced. This system applies two cameras for capturing the laser pattern and scattering images simultaneously. Three features are extracted from the scattering images to characterize the surface roughness. The light pattern images are processed to locate the defect and compute the size of the defect. Some experiments have been performed, and the experimental results verify the feasibility of the method.

Citation Download Citation

Ruipeng Guo and Dongliang Bian "Vision system for surface roughness and surface defect measurement," Optical Engineering 58(6), 064103 (13 June 2019). https://doi.org/10.1117/1.OE.58.6.064103

Received: 20 January 2019; Accepted: 20 May 2019; Published: 13 June 2019

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available