30 December 2021 One-shot fringe pattern analysis based on deep learning image denoiser
Di You, Jiangping Zhu, ZhiJuan Duan, Zhisheng You, Peng Cheng
Author Affiliations +
Abstract

Extracting phase from a single-frame fringe pattern is a key and challenging problem in fringe projection 3D measurement, especially for dynamic 3D measurement. We propose a single-shot phase extraction approach based on a low-pass filter with a well-trained image denoiser. Various comparative experiments have verified the effectiveness of the proposed method. More importantly, we associate the single-shot phase extraction problem with image denoising using deep learning. Thus more existing well-designed deep neural network models can be reused in the proposed method, without having to design a new model.

© 2021 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2021/$28.00 © 2021 SPIE
Di You, Jiangping Zhu, ZhiJuan Duan, Zhisheng You, and Peng Cheng "One-shot fringe pattern analysis based on deep learning image denoiser," Optical Engineering 60(12), 124113 (30 December 2021). https://doi.org/10.1117/1.OE.60.12.124113
Received: 1 August 2021; Accepted: 1 December 2021; Published: 30 December 2021
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Fringe analysis

Fourier transforms

Linear filtering

Neural networks

Phase shifts

3D modeling

Optical engineering

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