26 March 2022 Precision improvement in laser self-mixing nanoparticle sizing with all phase FFT amplitude correction
Ke Kou, Cuo Wang, Xian Wang, Jian Yan
Author Affiliations +
Abstract

As a well-known noncontact optical sensing technique, laser self-mixing interferometry (SMI) exhibits outstanding merits of low-cost, self-alignment, compactness, and high sensitivity, and it has been applied to typical geometrical quantity measurements, tomography, object imaging, as well as nanoparticle sizing. In SMI nanoparticle detection, as a result of Brownian motion, laser beam stochastically interacts with each particle in the illuminating volume, producing self-mixed signals with Lorentz shape power spectra, whose spectral broadening width is directly related with particle sizes. In general, FFT is always the first choice to obtain signals’ power spectra, but due to the influence of spectrum leakage, the heights of spectral lines may rise or fall and then change original Lorentz shapes and further increase sizing errors. Here, an all phase FFT (apFFT) method has been proposed to greatly suppress spectrum leakage, correct spectral line heights and further improve nanoparticle sizing errors for Rayleigh scattering cases. The apFFT method proposed is advantageous to developing precise SMI particle sensors or instruments, which may be applicable to chemical or medical applications.

© 2022 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2022/$28.00 © 2022 SPIE
Ke Kou, Cuo Wang, Xian Wang, and Jian Yan "Precision improvement in laser self-mixing nanoparticle sizing with all phase FFT amplitude correction," Optical Engineering 61(3), 034110 (26 March 2022). https://doi.org/10.1117/1.OE.61.3.034110
Received: 21 November 2021; Accepted: 8 March 2022; Published: 26 March 2022
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Nanoparticles

Particles

Optical engineering

Temperature metrology

Laser scattering

Laser interferometry

Laser applications

Back to Top