23 August 2023 Sensitivity analysis of a dielectric loaded 1 × 2 directional coupler switch based on foundry process optical waveguides
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Abstract

We examine the use of foundry process optical waveguide couplers in making 1 × 2 optical switches. The concept involves a post-foundry process to provide a moveable dielectric load over one of the waveguides in the coupler, such that the dielectric load changes the propagation constant of the affected waveguide depending on its proximity to the waveguide. Coupled mode theory is employed to explain the operation of the switch and identify key requirements of the dielectric load. Finite difference time domain simulations are employed to verify that the concept is viable for two standard photonic integrated circuit platforms. The concept ensures that the optical signals are always constrained within the high-quality foundry process waveguides while also allowing the material and lithography requirements for the layer in which the movable load is realized to be relaxed. Results show that a contrast between the switch ports of >20 dB is possible with relaxed tolerances for the dielectric load layer, at an operating wavelength of 1550 nm. We envision that the dielectric load would be moved by a micro-electromechanical systems actuator. Having the optical signals always within the foundry waveguides will permit fabrication of high-performance mechanically switched optical systems by a wide range of facilities.

© 2023 Society of Photo-Optical Instrumentation Engineers (SPIE)
Martin T. Hill, Dilusha Silva, Mariusz Martyniuk, and Lorenzo Faraone "Sensitivity analysis of a dielectric loaded 1 × 2 directional coupler switch based on foundry process optical waveguides," Optical Engineering 62(8), 087103 (23 August 2023). https://doi.org/10.1117/1.OE.62.8.087103
Received: 24 August 2022; Accepted: 1 August 2023; Published: 23 August 2023
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Cited by 1 scholarly publication.
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KEYWORDS
Waveguides

Optical switching

Dielectrics

Silicon nitride

Finite-difference time-domain method

Switches

Simulations

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