Prof. Simo Särkkä
at Aalto Univ.
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 15 October 2024
Harshit Agrawal, Ari Hietanen, Simo Särkkä
JMI, Vol. 11, Issue 05, 053501, (October 2024) https://doi.org/10.1117/12.10.1117/1.JMI.11.5.053501
KEYWORDS: Education and training, Cone beam computed tomography, Deep learning, Sensors, Computer simulations, Neural networks, Monte Carlo methods, X-rays, Windows, X-ray computed tomography

Proceedings Article | 1 April 2024 Poster + Paper
Harshit Agrawal, Ari Hietanen, Simo Särkkä
Proceedings Volume 12925, 1292539 (2024) https://doi.org/10.1117/12.3004168
KEYWORDS: Monte Carlo methods, Cone beam computed tomography, Neural networks, Deep learning, X-rays

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