Stability Of The Spectral Characteristics Of Ion Plated Interference Filters

Johannes Edlinger; Jurgen Ramm; Hans K. Pulker

doi:10.1117/12.950035

27 February 1989 Stability Of The Spectral Characteristics Of Ion Plated Interference Filters

Johannes Edlinger, Jurgen Ramm, Hans K. Pulker

Proceedings Volume 1019, Thin Film Technologies III; (1989) https://doi.org/10.1117/12.950035
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany

Abstract

Ta205/Si02, Zr02/SiO2 and TiO2/SiO2 multilayer optical interference filters were deposited in a Balzers2BAP 800 coatiftg plant by reactive low-voltage ion plating. The spectral filter characteristics were investigated with respect to time and temperature. The observed stability is correlated to the water and hydrogen contents. The temperature derivatives of the refractive index of TiO2, ZrO2 and Ta205 were estimated.

Citation Download Citation

Johannes Edlinger, Jurgen Ramm, and Hans K. Pulker "Stability Of The Spectral Characteristics Of Ion Plated Interference Filters", Proc. SPIE 1019, Thin Film Technologies III, (27 February 1989); https://doi.org/10.1117/12.950035

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available