Phase retrieval as an optical metrology tool

Gregory R. Brady; James R. Fienup

doi:10.1117/12.605914

2 May 2005 Phase retrieval as an optical metrology tool; Technical Digest

Gregory R. Brady, James R. Fienup

Proceedings Volume 10315, Optifab 2005: Technical Digest; 1031517 (2005) https://doi.org/10.1117/12.605914
Event: Optifab 2005, 2005, Rochester, NY, United States

Abstract

Phase retrieval can be useful in the measurement of optical surfaces and systems. It distinguishes itself through the simplicity of the experimental apparatus, just a detector array which collects light near a focal plane. Aspherics can be measured without null optics. The challenging part of the method is the estimation of the wavefront from the near-focus intensity measurements to reconstruct the wavefront.

Citation Download Citation

Gregory R. Brady and James R. Fienup "Phase retrieval as an optical metrology tool; Technical Digest", Proc. SPIE 10315, Optifab 2005: Technical Digest, 1031517 (2 May 2005); https://doi.org/10.1117/12.605914

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available