Real-time in-chip phase noise characterization of digitally controlled swept laser source

Zheyi Yao; Zhen Chen; Gerald Hefferman; Tao Wei

doi:10.1117/12.2295858

10 April 2018 Real-time in-chip phase noise characterization of digitally controlled swept laser source

Zheyi Yao, Zhen Chen, Gerald Hefferman, Tao Wei

Author Affiliations +

Proceedings Volume 10598, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2018; 105982M (2018) https://doi.org/10.1117/12.2295858
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2018, Denver, Colorado, United States

Abstract

Distributed optical fiber sensors are increasingly utilized method of distributed strain and temperature sensing, and the swept laser source plays an significant role in these applications. However, there is dynamic frequency-noise as the laser sweeping. In this paper, we proposed and experimentally demonstrated a real-time in-situ phase noise detecting method in a field programmable gate array (FPGA) chip, which permits accurate and insightful investigation of laser stability. This method takes only 1 clock cycle to capture the phase noise.

Conference Presentation

Citation Download Citation

Zheyi Yao, Zhen Chen, Gerald Hefferman, and Tao Wei "Real-time in-chip phase noise characterization of digitally controlled swept laser source", Proc. SPIE 10598, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2018, 105982M (10 April 2018); https://doi.org/10.1117/12.2295858

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