Sources of errors in structured light 3D scanners

Prem Rachakonda; Bala Muralikrishnan; Daniel Sawyer

doi:10.1117/12.2518126

13 May 2019 Sources of errors in structured light 3D scanners

Prem Rachakonda, Bala Muralikrishnan, Daniel Sawyer

Proceedings Volume 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII; 1099106 (2019) https://doi.org/10.1117/12.2518126
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, MD, United States

Abstract

Structured light scanners have been commercially available for over a decade and some commercial scanners are evaluated using one of two German guidelines – VDI/VDE 2634 parts 2 and/or 3. Several other research groups have developed physical artifacts that are agnostic to instrument construction and are purpose driven. The use of such guidelines and artifacts is not well understood for instruments which have a variety of sensor configurations and capabilities. It is also not clear if these guidelines/artifacts are sensitive to all the sources of errors that are present in these systems. In this context, this paper will describe the ongoing activities at NIST to study various sources of errors in structured light scanners with an objective of characterizing their performance.

Citation Download Citation

Prem Rachakonda, Bala Muralikrishnan, and Daniel Sawyer "Sources of errors in structured light 3D scanners", Proc. SPIE 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII, 1099106 (13 May 2019); https://doi.org/10.1117/12.2518126

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