Prem Rachakonda
Mechanical Engineer at National Institute of Standards & Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

Proceedings Article | 13 May 2019 Paper
Prem Rachakonda, Bala Muralikrishnan, Daniel Sawyer
Proceedings Volume 10991, 1099106 (2019) https://doi.org/10.1117/12.2518126
KEYWORDS: Scanners, Cameras, Calibration, 3D scanning, Structured light, Standards development, 3D imaging metrology, Dimensional metrology

Conference Committee Involvement (5)
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XI
5 April 2022 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications X
12 April 2021 | Online Only, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
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