Precision focusing mirror alignment at SACLA using new nanobeam diagnosis (Conference Presentation)

Takato Inoue; Satoshi Matsuyama; Nami Nakamura; Hirokatsu Yumoto; Yuichi Inubushi; Takahisa Koyama; Taito Osaka; Ichiro Inoue; Kensuke Tono; Haruhiko Ohashi; Makina Yabashi; Tetsuya Ishikawa; Kazuto Yamauchi

doi:10.1117/12.2526972

9 September 2019 Precision focusing mirror alignment at SACLA using new nanobeam diagnosis (Conference Presentation)

Takato Inoue, Satoshi Matsuyama, Nami Nakamura, Hirokatsu Yumoto, Yuichi Inubushi, Takahisa Koyama, Taito Osaka, Ichiro Inoue, Kensuke Tono, Haruhiko Ohashi, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi

Author Affiliations +

Proceedings Volume 11108, Advances in X-Ray/EUV Optics and Components XIV; 1110802 (2019) https://doi.org/10.1117/12.2526972
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

Focusing X-ray free-electron lasers (XFELs) is very important for producing ultra-intense X-ray nanoprobes. We have developed a system based on multilayer Kirkpatrick–Baez (KB) mirrors to focus XFELs to 10 nm or less at the SPring-8 Angstrom Compact free-electron LAser (SACLA) facility. The mirror optics in the system are designed with a large NA of greater than 0.01 to produce a diffraction-limited size of 6 nm at 9 keV. We constructed a precise X-ray grating interferometer based on the Talbot effect, and succeeded in fabricating near-perfect focusing mirrors with wavefront aberrations of λ/4. However, strict error tolerances for mirror alignment can prevent sub-10 nm focusing. Errors of perpendicularity, incident angle, and astigmatism cause aberration on the focusing wavefront and characteristically change the beam shape. In particular, the required accuracy of the incident angle is 500 nrad. Due to shot-by-shot variations in the XFEL beam position and vibration of the optics, a single-shot diagnosis of beam shape is essential to align the mirrors quickly and accurately. By improving the method proposed by Sikorski et al. at the Stanford Linear Accelerator Center (SLAC), National Accelerator Laboratory, we propose a nanobeam diagnosis method based on the speckle pattern observed under coherent scattering. Computer simulation revealed that speckle size and beam size are inversely proportional. Platinum particles with a diameter of 2 nm were prepared and irradiated with X-rays to obtain a speckle pattern. Our experimental results demonstrate the successful estimation of beam shape and the alignment of all mirrors with the required accuracies.

Conference Presentation

Citation Download Citation

Takato Inoue, Satoshi Matsuyama, Nami Nakamura, Hirokatsu Yumoto, Yuichi Inubushi, Takahisa Koyama, Taito Osaka, Ichiro Inoue, Kensuke Tono, Haruhiko Ohashi, Makina Yabashi, Tetsuya Ishikawa, and Kazuto Yamauchi "Precision focusing mirror alignment at SACLA using new nanobeam diagnosis (Conference Presentation)", Proc. SPIE 11108, Advances in X-Ray/EUV Optics and Components XIV, 1110802 (9 September 2019); https://doi.org/10.1117/12.2526972

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
PRESENTATION

WATCH
PRESENTATION SAVE TO MY LIBRARY

GET CITATION

KEYWORDS

Mirrors

Beam shaping

X-rays

Free electron lasers

Speckle pattern

Diffraction gratings

Interferometers

Show All Keywords

Keywords/Phrases

Search In:

Publication Years