Presentation + Paper
20 August 2020 Design and measurements of n for the multicomponent semiconductor
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Abstract
A great deal of research has been performed on refractive index n and extinction coefficient k due to varieties of applications in optical industries. The dispersion equation is described for the photons of varying energies and their interactions with materials since there is a strong correlation of n and k with wavelength. Measurements based on reflectance can be expensive and are very difficult due to compositional variations. We present a low-cost reflectance probe fiber optics designed in-house to determine the absorption coefficients and refractive index of solids. The solutions using a modified Beer-Lamberts Law and merging the concentration and extinction coefficient terms into an absorption coefficient, α, can be given by the equation I = I0 exp (-α* d) where I is the transmitted intensity, I0 is incident intensity and d is the thickness. We have experimented with several semiconductor compounds for this study.
Conference Presentation
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Brett Setera, Bradley Arnold, Fow-Sen Choa, Lisa Kelly, Ian Emge, Charmain Su, Krishna S. Machuga, and N. B. Singh "Design and measurements of n for the multicomponent semiconductor", Proc. SPIE 11498, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIV, 1149803 (20 August 2020); https://doi.org/10.1117/12.2566997
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KEYWORDS
Reflectivity

Refractive index

Absorption

Fiber optics

Additive manufacturing

Crystals

3D modeling

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