Characterization of photon counting detectors for x-ray diffraction (XRD) applications

Sarah D. Ruiz; Zachary W. Gude; Ava X. Hurlock; Kyle Ferguson; Casey Miller; Joshua H. Carpenter; Joel A. Greenberg; Michael E. Gehm

doi:10.1117/12.2618954

3 June 2022 Characterization of photon counting detectors for x-ray diffraction (XRD) applications

Sarah D. Ruiz, Zachary W. Gude, Ava X. Hurlock, Kyle Ferguson, Casey Miller, Joshua H. Carpenter, Joel A. Greenberg, Michael E. Gehm

Author Affiliations +

Proceedings Volume 12104, Anomaly Detection and Imaging with X-Rays (ADIX) VII; 121040A (2022) https://doi.org/10.1117/12.2618954
Event: SPIE Defense + Commercial Sensing, 2022, Orlando, Florida, United States

Abstract

Photon counting detectors with energy resolving capabilities have the potential to improve computed tomography (CT) imaging and x-ray diffraction (XRD) systems. In order to better understand the use of these detectors in the CT and XRD application spaces, we have experimentally investigated the detector performance of two newly-released photon counting detectors: the Redlen LDA detector and the Kromek D-Matrix v2 detector. Detector performance involves a complicated interplay of semiconductor physics and readout electronics, and the outcome can depend crucially on the properties of the incoming X-rays—specifically the flux and spectral content. Although the LDA and D-Matrix v2 detectors differ in many ways, particularly in the manner in which they collect spectroscopic information, both are of interest for CT and XRD modalities. We report on our analysis of the detector performance, including the noise statistics, detector quantum efficiency, response linearity, and energy resolution of the detectors as well as discuss how our findings influence the use of these detectors in diffraction and transmission measurements.

Conference Presentation

Citation Download Citation

Sarah D. Ruiz, Zachary W. Gude, Ava X. Hurlock, Kyle Ferguson, Casey Miller, Joshua H. Carpenter, Joel A. Greenberg, and Michael E. Gehm "Characterization of photon counting detectors for x-ray diffraction (XRD) applications", Proc. SPIE 12104, Anomaly Detection and Imaging with X-Rays (ADIX) VII, 121040A (3 June 2022); https://doi.org/10.1117/12.2618954

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available