SIM-SEG code giving a complete insight into electronic and photovoltaic performances basing on non-destructive optical measurements

Marek Basta; Zbigniew T. Kuznicki; Mikaël Hosatte

doi:10.1117/12.2622101

24 May 2022 SIM-SEG code giving a complete insight into electronic and photovoltaic performances basing on non-destructive optical measurements

Marek Basta, Zbigniew T. Kuznicki, Mikaël Hosatte

Author Affiliations +

Proceedings Volume 12150, Photonics for Solar Energy Systems IX; 121500B (2022) https://doi.org/10.1117/12.2622101
Event: SPIE Photonics Europe, 2022, Strasbourg, France

Conference Poster

Abstract

A nondestructive insight into properties of nanoscale Si-layered system buried within a crystalline wafer is possible due adequate numerical analysis of dielectric functions and optical parameters. The investigation and development were made on an example of the heavily doped and/or highly excited Si:P. The comparison of predicted and measured performances was made on high efficiency bi-facial silicon solar cells.

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Marek Basta, Zbigniew T. Kuznicki, and Mikaël Hosatte "SIM-SEG code giving a complete insight into electronic and photovoltaic performances basing on non-destructive optical measurements", Proc. SPIE 12150, Photonics for Solar Energy Systems IX, 121500B (24 May 2022); https://doi.org/10.1117/12.2622101

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