Paper
26 May 2011 Infrared surface waves on semiconductor and conducting polymer
Monas Shahzad, Gautam Medhi, R. E. Peale, Ryuichi Tsuchikawa, Masahiro Ishigami, Walter Buchwald, Justin Cleary, Glenn D. Boreman, Oliver Edwards, D. J. Diaz, Ted A. Gorman
Author Affiliations +
Abstract
Conductors with infrared plasma frequencies are potentially useful hosts of surface electromagnetic waves with sub-wavelength mode confinement for sensing applications. Such materials include semimetals, semiconductors, and conducting polymers. In this paper we present experimental and theoretical investigations of surface waves on doped silicon and the conducting polymer polyaniline (PANI). Resonant absorption features were measured in reflection from lamellar gratings made from doped silicon for various p-polarized CO2 laser wavelengths. The angular reflectance spectra for doped silicon was calculated and compared with the experiments using experimental complex permittivities determined from infrared (IR) ellipsometry data. Polyaniline films were prepared, optical constants determined, and resonance spectra calculated also. A specific goal is to identify a conductor having tight mode confinement, sharp reflectivity resonances, and capability to be functionalized for biosensor applications.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Monas Shahzad, Gautam Medhi, R. E. Peale, Ryuichi Tsuchikawa, Masahiro Ishigami, Walter Buchwald, Justin Cleary, Glenn D. Boreman, Oliver Edwards, D. J. Diaz, and Ted A. Gorman "Infrared surface waves on semiconductor and conducting polymer", Proc. SPIE 8024, Advanced Environmental, Chemical, and Biological Sensing Technologies VIII, 80240B (26 May 2011); https://doi.org/10.1117/12.884090
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Cited by 6 scholarly publications.
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KEYWORDS
Silicon

Infrared radiation

Reflectivity

Polymers

Ellipsometry

Semiconductors

Biosensors

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