High-sensitivity hyperspectral Fourier-plane microscopy by an innovative common-path interferometer

Armando Genco; Cristina Cruciano; Matteo Corti; Kirsty E. McGhee; Benedetto Ardini; Tersilla Virgili; David G. Lidzey; Andrea Bassi; Gianluca Valentini; Giulio Cerullo; Cristian Manzoni

doi:10.1117/12.2649712

8 March 2023 High-sensitivity hyperspectral Fourier-plane microscopy by an innovative common-path interferometer

Armando Genco, Cristina Cruciano, Matteo Corti, Kirsty E. McGhee, Benedetto Ardini, Tersilla Virgili, David G. Lidzey, Andrea Bassi, Gianluca Valentini, Giulio Cerullo, Cristian Manzoni

Author Affiliations +

Proceedings Volume 12428, Photonic Instrumentation Engineering X; 124280F (2023) https://doi.org/10.1117/12.2649712
Event: SPIE OPTO, 2023, San Francisco, California, United States

Abstract

Fourier-plane optical microscopy is a powerful technique for studying the angularly-resolved optical properties of a plethora of materials and devices. The information about the direction of the emission of light by a sample is extracted by imaging the objective back focal plane on a two-dimensional detector, via a suitable optical system. This imaging technique is able to resolve the angular spectrum of the light over a wide angular field of view, but typically it doesn’t provide any spectral information, since it integrates the light intensity over a broad wavelength range. On the other hand, advanced hyperspectral imaging techniques are able to record the spectrum of the transmitted/reflected/emitted light at each pixel of the detector. In this work, we combine an innovative hyperspectral imaging system with Fourier-space microscopy, and we apply the novel device to the characterization of planar organic microcavities. In our system, hyperspectral imaging is performed by Fourier-transform spectroscopy thanks to an innovative common-path birefringent interferometer: it generates two delayed replicas of the light field, whose interference pattern is recorded as a function of their delay. The Fourier Transform of the resulting interferogram yields the intensity spectrum for each element of the microscope angular field-of-view. This system provides an angle-resolved hyperspectral view of the microcavities. The hyperspectral Fourier-space image clearly evidences the cavity modes both in photoluminescence and reflection, whose energy has a parabolic dependence on the emission angle. From the hyperspectral image, we reconstruct a 3D view of the parabolic cavity dispersion across the whole Fourier space.

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Armando Genco, Cristina Cruciano, Matteo Corti, Kirsty E. McGhee, Benedetto Ardini, Tersilla Virgili, David G. Lidzey, Andrea Bassi, Gianluca Valentini, Giulio Cerullo, and Cristian Manzoni "High-sensitivity hyperspectral Fourier-plane microscopy by an innovative common-path interferometer", Proc. SPIE 12428, Photonic Instrumentation Engineering X, 124280F (8 March 2023); https://doi.org/10.1117/12.2649712

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