Sensitivity measurement in x-ray phase-contrast imaging using cascaded grating interferometers

Jianheng Huang; Jingjia Yang; Minghui Zhu; Chengming Feng; Yaohu Lei; Xin Liu; Qiang Yang; Ji Li

doi:10.1117/12.2654454

9 January 2023 Sensitivity measurement in x-ray phase-contrast imaging using cascaded grating interferometers

Jianheng Huang, Jingjia Yang, Minghui Zhu, Chengming Feng, Yaohu Lei, Xin Liu, Qiang Yang, Ji Li

Proceedings Volume 12507, Advanced Optical Manufacturing Technologies and Applications 2022; and 2nd International Forum of Young Scientists on Advanced Optical Manufacturing (AOMTA and YSAOM 2022); 125070J (2023) https://doi.org/10.1117/12.2654454
Event: 2nd International Forum of Young Scientists on Advanced Optical Manufacturing (AOMTA and YSAOM 2022), 2022, Changchun, China

Abstract

It is known that the sensitivity of X-ray phase-contrast grating interferometry with regard to electron density variations present in the sample is related to the minimum detectable refraction angle. In this article an X-ray phase template is developed that allows for a realistic and quantitative determination of the sensitivity in X-ray phase-contrast imaging using cascaded grating interferometers. The template is designed as a periodic structure composed of different inclination angles and fabricated on a PMMA substrate. Fourier analysis of the moiré fringe patterns generated by the interferometer is used to obtain the phase-contrast image of the template. Experimental results show that the sensitivity, i.e. the minimum detectable refraction angle of this interferometer, is between 0.1 μrad and 0.2 μrad for the template with structure period of 4 mm. This work will help to evaluate and optimize existing cascaded grating interferometers for x-ray differential phase-contrast imaging.

Citation Download Citation

Jianheng Huang, Jingjia Yang, Minghui Zhu, Chengming Feng, Yaohu Lei, Xin Liu, Qiang Yang, and Ji Li "Sensitivity measurement in x-ray phase-contrast imaging using cascaded grating interferometers", Proc. SPIE 12507, Advanced Optical Manufacturing Technologies and Applications 2022; and 2nd International Forum of Young Scientists on Advanced Optical Manufacturing (AOMTA and YSAOM 2022), 125070J (9 January 2023); https://doi.org/10.1117/12.2654454

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KEYWORDS

X-rays

Interferometers

X-ray imaging

Refraction

Phase shifts

Phase measurement

Absorption

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