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X-ray phase and dark field imaging offer two additional channels of information to enhance image contrast as well as providing information on material micro-texture that is unavailable to conventional x-ray imaging. These signals are commonly acquired by using multiple precisely aligned, fine-pitched gratings to both pattern the beam and to detect subtle shifts and blurring in this pattern. We instead use a single, low-cost, easily-aligned, coarse-pitched mesh to produce a pattern that is imaged directly to produce phase and dark field computed tomography (CT) images. We demonstrate phase and CT reconstructions using our system for a variety of phantoms.
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Wadiah H. Allahyani, Uttam Pyakurel, Arthur Redgate, Carolyn A. MacDonald, Jonathan C. Petruccelli, "Initial investigation of mesh-based x-ray phase tomography," Proc. SPIE 12523, Computational Imaging VII
, 125230C (13 June 2023); https://doi.org/10.1117/12.2665371