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6 June 2023 Laser-driven photon sources and exemplary applications at ELI Beamlines (Conference Presentation)
Dong-Du Mai, Ondrej Hort, Uddhab Chaulagain, Matej Jurkovic, Martin Albrecht, Ondrej Finke, Yelizaveta Pulnova, Marcel Lamac, Marek Raclavsky, Kavya Hemantha Rao, Jaroslav Nejdl, Sergei Bulanov
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Proceedings Volume 12578, Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8); 125780A (2023) https://doi.org/10.1117/12.2665584
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic
Abstract
The ELI Beamlines project as one pillar of the Extreme Light Infrastructure ERIC provides laser-driven secondary sources of EUV/XUV, X-ray and relativistic charged particles offering unique pump/probe experimental schemes for dynamic studies on the ultrafast time-scale. Moreover, these sources can be coupled together offering experimental schemes beyond the IR-laser-driven pump/probe approach. While the majority of facility scientific equipment is in progress of installation, numerous secondary beamlines have already been validated. Here we present secondary sources of XUV radiation via high harmonic generation (HHG) in gases and hard X-ray Cu-Ka source as well as user endstations that were connected to the beamline. The ELI Beamlines HHG/PXS supports experiments in three scientific end stations: MAC, ELIps, and T-REX, while plasma betatron source and lUIS will serve their own beamlines and endstations.
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© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Dong-Du Mai, Ondrej Hort, Uddhab Chaulagain, Matej Jurkovic, Martin Albrecht, Ondrej Finke, Yelizaveta Pulnova, Marcel Lamac, Marek Raclavsky, Kavya Hemantha Rao, Jaroslav Nejdl, and Sergei Bulanov "Laser-driven photon sources and exemplary applications at ELI Beamlines (Conference Presentation)", Proc. SPIE 12578, Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8), 125780A (6 June 2023); https://doi.org/10.1117/12.2665584
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KEYWORDS
Laser applications
Extreme ultraviolet
X-rays
Coherence imaging
Ellipsometry
Hard x-rays
Particles
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