Measurement of the orientation of the fast/slow axis and surface roughness for birefringent material

Jiamiao Lei; Wenxuan Liu; Yicheng Tuo; Steen G. Hanson; Mitsuo Takeda; Wei Wang

doi:10.1117/12.3021239

4 March 2024 Measurement of the orientation of the fast/slow axis and surface roughness for birefringent material

Jiamiao Lei, Wenxuan Liu, Yicheng Tuo, Steen G. Hanson, Mitsuo Takeda, Wei Wang

Proceedings Volume 13070, Speckle 2023: VIII International Conference on Speckle Metrology; 130700Z (2024) https://doi.org/10.1117/12.3021239
Event: Speckle 2023: VIII International Conference on Speckle Metrology, 2023, Xi'an, China

Abstract

When light propagates in a heterogeneous object, its propagation speed and refractive index value usually change with different vibration directions. However, when light passes through a heterogeneous optical crystal from a particular direction, no birefringence occurs, and this special direction is the optical axis of the birefringent material. Presently, the traditional measurement method for determining the optical axis relies on scalar imaging, which can only characterize scalars and cannot characterize polarization. Given the anisotropy of birefringent materials, it becomes difficult to determine the optical axis and measure the surface roughness. Speckle method, as an important non-contact measurement method, has gradually become the main method for measuring surface roughness due to its advantages such as small error and easy operation. The purpose of this article is to provide a device and method, to solve the problems of measuring the optical axis and roughness of birefringent materials, simultaneously.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Jiamiao Lei, Wenxuan Liu, Yicheng Tuo, Steen G. Hanson, Mitsuo Takeda, and Wei Wang "Measurement of the orientation of the fast/slow axis and surface roughness for birefringent material", Proc. SPIE 13070, Speckle 2023: VIII International Conference on Speckle Metrology, 130700Z (4 March 2024); https://doi.org/10.1117/12.3021239

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