Automatic test comes to focal plane array production

Frank L. Skaggs; T. D. Barton

doi:10.1117/12.137766

12 August 1992 Automatic test comes to focal plane array production

Frank L. Skaggs, T. D. Barton

Proceedings Volume 1683, Infrared Focal Plane Array Producibility and Related Materials; (1992) https://doi.org/10.1117/12.137766
Event: Aerospace Sensing, 1992, Orlando, FL, United States

Abstract

To meet the needs of military and commercial markets, the infrared focal plane array industry must develop new, effective and low cost methods of fabricating and testing imaging detectors. This paper describes Texas Instruments new concepts in automated testing and cold probe technology as they apply to volume production.

Citation Download Citation

Frank L. Skaggs and T. D. Barton "Automatic test comes to focal plane array production", Proc. SPIE 1683, Infrared Focal Plane Array Producibility and Related Materials, (12 August 1992); https://doi.org/10.1117/12.137766

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