Paper
1 December 1993 Design review of a high-accuracy UV to near-IR scatterometer
Tod F. Schiff, Mary W. Knighton, Daniel J. Wilson, Fredrick M. Cady, John C. Stover, James J. Butler
Author Affiliations +
Abstract
A unique broadband scatterometer has been designed, built and tested for NASA Goddard. One use of the instrument will be to accurately measure the BRDF of calibration standards used by shuttle astronauts in experiments to measure atmospheric ozone. BRDF accuracy is better than 1% except for angles of incidence and scatter greater than 80 degrees. The source employs a high intensity xenon arc and programmable monochromator that allows measurements to be made anywhere from 0.23 to 0.9 micrometers over adjustable bandwidths as small as four nanometers. The goniometer allows out-of-plane measurements to be made in either transmission or reflection from horizontal samples.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tod F. Schiff, Mary W. Knighton, Daniel J. Wilson, Fredrick M. Cady, John C. Stover, and James J. Butler "Design review of a high-accuracy UV to near-IR scatterometer", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162643
Lens.org Logo
CITATIONS
Cited by 23 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Error analysis

Silicon

Bidirectional reflectance transmission function

Receivers

External quantum efficiency

Laser scattering

Calibration

RELATED CONTENT

Round robin of painted targets BRDF measurements
Proceedings of SPIE (July 24 2000)
Sinusoidal surfaces as standards for BRDF instruments
Proceedings of SPIE (December 01 1991)
An ERIM Perspective On BRDF Measurement Technology
Proceedings of SPIE (January 02 1990)
BRDF Error Analysis
Proceedings of SPIE (January 02 1990)

Back to Top