Characterization of polycrystalline phosphors for area x-ray detectors

Sol M. Gruner; Sandor L. Barna; Michael E. Wall; Mark W. Tate; Eric F. Eikenberry

doi:10.1117/12.164729

16 December 1993 Characterization of polycrystalline phosphors for area x-ray detectors

Sol M. Gruner, Sandor L. Barna, Michael E. Wall, Mark W. Tate, Eric F. Eikenberry

Proceedings Volume 2009, X-Ray Detector Physics and Applications II; (1993) https://doi.org/10.1117/12.164729
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Incorporation of polycrystalline phosphor screens into efficient, high precision x-ray detectors requires an understanding of the subtleties of x-ray capture and subsequent light transmission in the screen, as well as an awareness of how phosphors affect detector calibration. We discuss the preparation of such phosphor screens and their characterization with respect to efficiency, stopping power, spatial resolution, decay time, and spectral output.

Citation Download Citation

Sol M. Gruner, Sandor L. Barna, Michael E. Wall, Mark W. Tate, and Eric F. Eikenberry "Characterization of polycrystalline phosphors for area x-ray detectors", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164729

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