Performance of detectors for x-ray crystallography

Martin J. Stanton; Walter Charles Phillips

doi:10.1117/12.164733

16 December 1993 Performance of detectors for x-ray crystallography

Martin J. Stanton, Walter Charles Phillips

Proceedings Volume 2009, X-Ray Detector Physics and Applications II; (1993) https://doi.org/10.1117/12.164733
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The performance of a detector can be characterized by its efficiency for measuring individual x-rays or for measuring Bragg peak intensities. The performance for detecting individual x- rays or for measuring Bragg peak intensities. The performance for detecting individual x-rays is well modeled by the DQE. The performance for measuring Bragg peak intensities in the presence of an x-ray background can be modeled by an expanded definition of the DQE which allows inclusion of experimental constraints, the XDCE. These constraints include the observation that by increasing the crystal-to-detector distance and using a larger detector, Bragg peaks can be better resolved and the x-ray background reduced. Calculation of the XDCE for a detector consisting of a fiberoptic taper with a phosphor x-ray convertor deposited on the large end and a CCD bonded to the small end demonstrate the need to make the detector area relatively large, possibly at the expense of a decrease in the DQE.

Citation Download Citation

Martin J. Stanton and Walter Charles Phillips "Performance of detectors for x-ray crystallography", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164733

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KEYWORDS

Sensors

X-ray detectors

X-rays

Crystals

Sensor performance

Signal detection

CCD image sensors

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