Application of a charge-coupled device as an x-ray polarimeter

Hiroshi Tsunemi; Kiyoshi Hayashida; Keisuke Tamura; Susumu Nomoto; Mikio Wada; Emi Miyata; Noriuki Miura

doi:10.1117/12.168581

15 February 1994 Application of a charge-coupled device as an x-ray polarimeter

Hiroshi Tsunemi, Kiyoshi Hayashida, Keisuke Tamura, Susumu Nomoto, Mikio Wada, Emi Miyata, Noriuki Miura

Proceedings Volume 2010, X-Ray and Ultraviolet Polarimetry; (1994) https://doi.org/10.1117/12.168581
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

We report here the results of polarized X-ray detection with a charge-coupled device (CCD). The photoelectron produced in the CCD is mainly ejected along the electric vector of the incident X-ray. This means that the primary charge cloud mainly remains in the depletion layer if the photo absorption occurs in it. Therefore, a primary charge cloud is elongated towards the X-ray polarization vector. The range of the electron in the silicon is roughly expressed (E/10 keV)^1.75 micrometers where E is the electron energy in KeV. Therefore, the range of the photoelectron in this energy region is at most two-pixel length. We investigated the relation between the direction of the linear polarization of X-rays and the statistics of the charge cloud shape.

Citation Download Citation

Hiroshi Tsunemi, Kiyoshi Hayashida, Keisuke Tamura, Susumu Nomoto, Mikio Wada, Emi Miyata, and Noriuki Miura "Application of a charge-coupled device as an x-ray polarimeter", Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); https://doi.org/10.1117/12.168581

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