Paper
25 September 1995 Hard x-ray microanalytical beam line at the CAMD synchrotron
Mark C. Petri, Leonard Leibowitz, Paul Schilling
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Abstract
Argonne National Laboratory (ANL) is collaborating with Louisiana State University (LSU) in constructing a synchrotron x-ray micro-analytical beamline at the Center for Advanced Microstructures and Devices (CAMD) in Baton Rouge, Louisiana. This project grew from earlier work at the National Synchrotron Light Source (NSLS), where a team of ANL researchers developed techniques to examine small-scale structures in diffusion zones of a variety of materials. The ANL/CAMD beamline will use x-ray fluorescence, diffraction, and absorption spectroscopy techniques to reveal both compositional and structural information on a microscopic scale.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark C. Petri, Leonard Leibowitz, and Paul Schilling "Hard x-ray microanalytical beam line at the CAMD synchrotron", Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); https://doi.org/10.1117/12.221672
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KEYWORDS
X-rays

Diffusion

Synchrotrons

Luminescence

X-ray diffraction

Diffraction

X-ray fluorescence spectroscopy

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