Recognition by synthesis: a new approach for the recognition of material faults in HNDE

Wolfgang Osten; Frank Elandaloussi; Werner P. O. Jueptner

doi:10.1117/12.245170

19 July 1996 Recognition by synthesis: a new approach for the recognition of material faults in HNDE

Wolfgang Osten, Frank Elandaloussi, Werner P. O. Jueptner

Proceedings Volume 2861, Laser Interferometry VIII: Applications; (1996) https://doi.org/10.1117/12.245170
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

In quality control nondestructive techniques gain more and more importance. Holographic interferometry has the advantage of being very sensitive and can be used contactless for inspection of technical components. The interferogram contains fringes, whose pattern holds information about the surface deformation as a part subjected to the load. The detection of faulty parts is usually done by an expert who is used to interpret the interferogram. The automation of this procedure raises several problems, due more specifically to a bad discrimination of the classes of flaws. This paper describes a method for recognition of fault indicating patterns by synthesis of the interferograms, the comparison with the real pattern and modification of the simulation strategy with respect to the classification of the flaw. Taking into account the experimental conditions and a first hypothesis about the type of flaw within the object, a synthesized image of the fringes can be generated and compared to the experimental image. Based on the found hypothesis the experimental load and set-up are changed if the synthesized and experimental fringes differ. First results of this new approach are reported.

Citation Download Citation

Wolfgang Osten, Frank Elandaloussi, and Werner P. O. Jueptner "Recognition by synthesis: a new approach for the recognition of material faults in HNDE", Proc. SPIE 2861, Laser Interferometry VIII: Applications, (19 July 1996); https://doi.org/10.1117/12.245170

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