Paper
31 December 1996 Application of the synthetic holographic interferometry in real-time measurement
Author Affiliations +
Proceedings Volume 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96); (1996) https://doi.org/10.1117/12.263116
Event: International Conference on Holography and Optical Information Processing, 1996, Nanjing, China
Abstract
Based on the rotating prism multiple holography and real- time method, we present a new technique which is a synthetic holographic interferometry. The usage of the technique can record both double-exposure hologram and single-exposure hologram on a single holofilm. The usage of rotating prism can modulate plane reference waves to record multiple holograms. When the multiple hologram is exactly restituted and the incident angle of plane reconstruction waves equals a modulated angle of plane reference wave, the reconstructed original image is at the same place as the original object. The place is used as a channel of real-time observation and the others are served to record double-exposure holograms. In this way, both single-exposure and double-exposure holographies can be realized on a holofilm. Observing simultaneously interferograms at standard state recorded by double exposure and `living fringe' provided by real-time method, we can compare the change of standard state with states of different times. The paper presents a synthetic holographic interferometry and provides a new method for precise real-time measurement.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhimin Zhao, Youyi Lin, and Hongmin Yu "Application of the synthetic holographic interferometry in real-time measurement", Proc. SPIE 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96), (31 December 1996); https://doi.org/10.1117/12.263116
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KEYWORDS
Holograms

Holographic interferometry

3D image reconstruction

Holography

Prisms

Time metrology

Modulation

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