Paper
11 December 1998 Fabrication and performance of etched multilayer x-ray optics
Zhanshan Wang, Yueying Ma, Jianlin Cao, Xingdan Chen, Xiangdong Xu, Yilin Hong, Shaojun Fu
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Abstract
We present the recent advances achieved in the Changchun Institute of Optics and Fine Mechanics, Chinese Academy of Science, in the field of the soft X-ray etched multilayer optics. In the present study, Mo and Si have been chosen as materials for the scattering layer and space layer soft X-ray multilayer, respectively. The fabrication of Mo/Si multilayer used by the magnetron sputtering, the patterned resist was obtained by optical holography, and the pattern of the resist was transferred into the multilayer by the ion beam etching. The several components based on soft X-ray etched multilayer were measured by grazing incidence X-ray reflectance measurements at (lambda) equals 0.154 nm (Cu-K(alpha )) using a conventional diffractometer.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhanshan Wang, Yueying Ma, Jianlin Cao, Xingdan Chen, Xiangdong Xu, Yilin Hong, and Shaojun Fu "Fabrication and performance of etched multilayer x-ray optics", Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); https://doi.org/10.1117/12.332521
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KEYWORDS
Multilayers

X-rays

X-ray optics

Zone plates

Etching

Diffraction gratings

X-ray diffraction

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