Further evaluation of the Exicor birefringence measurement system

Baoliang Bob Wang

doi:10.1117/12.403586

11 October 2000 Further evaluation of the Exicor birefringence measurement system

Baoliang Bob Wang

Proceedings Volume 4103, Optical Diagnostic Methods for Inorganic Materials II; (2000) https://doi.org/10.1117/12.403586
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

We recently developed a linear birefringence measurement instrument, known as the Exicor system, using photoelastic modulator (PEM) technology. We have reported the precision and short-term stability of this instrument. In this paper, the author further evaluates the accuracy, long-term stability, and instrumental performance under low light intensity levels of the Exicor system.

Citation Download Citation

Baoliang Bob Wang "Further evaluation of the Exicor birefringence measurement system", Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); https://doi.org/10.1117/12.403586

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