Paper
18 December 2000 High-resolution x-ray image sensors based on HgI2
Robert A. Street, Marcelo Mulato, Steve E. Ready, Rachel Lau, Jackson Ho, Koenraad Van Schuylenbergh, Michael M. Schieber, Haim Hermon, Asaf Zuck, Alexander I. Vilensky
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Abstract
Measurements of polycrystalline HgI2 films on active matrix direct detection image sensors are described, for possible application to high sensitivity room temperature x- ray detection. The arrays exhibit low leakage current and very high sensitivity - roughly an order of magnitude better than has been demonstrated with other designs. The uniformity of the response varies randomly from pixel to pixel, for reasons that are not yet understood, but are probably related to the large grain size.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert A. Street, Marcelo Mulato, Steve E. Ready, Rachel Lau, Jackson Ho, Koenraad Van Schuylenbergh, Michael M. Schieber, Haim Hermon, Asaf Zuck, and Alexander I. Vilensky "High-resolution x-ray image sensors based on HgI2", Proc. SPIE 4142, Penetrating Radiation Systems and Applications II, (18 December 2000); https://doi.org/10.1117/12.410562
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Cited by 14 scholarly publications.
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KEYWORDS
X-rays

Image sensors

X-ray imaging

Interference (communication)

Ionization

Absorption

Modulation transfer functions

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