Paper
29 June 2001 Fabrication and characterization of Bragg gratings in Er-Yb-doped glass waveguides using interferometric method
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Proceedings Volume 4430, ROMOPTO 2000: Sixth Conference on Optics; (2001) https://doi.org/10.1117/12.432884
Event: ROMOPTO 2000: Sixth Conference on Optics, 2000, Bucharest, Romania
Abstract
In this paper we report some experimental results concerning the fabrication of Bragg gratings with submicronic period in Er-Yb-doped glass waveguides using interferometric method and of a monolithically integrated DFB laser. Also, a method used for monitoring the development process in real time using data acquisition program on a Labview platform and some results related to the characterization of the waveguides with gratings in reflection mode and a monolithically integrated DFB laser pumped at 980 nm are presented and discussed. These results can be used for the improvement of the fabrication processes of the above mentioned devices and optical integrated circuits.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Florea, Jean-Emmanuel Broquin, Sylvain Blaize, and Niculae N. Puscas "Fabrication and characterization of Bragg gratings in Er-Yb-doped glass waveguides using interferometric method", Proc. SPIE 4430, ROMOPTO 2000: Sixth Conference on Optics, (29 June 2001); https://doi.org/10.1117/12.432884
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KEYWORDS
Waveguides

Glasses

Interferometry

Fiber Bragg gratings

Semiconducting wafers

Ions

LabVIEW

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