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16 January 2002 Evaluation of experimental laser-induced-damage assessment techniques for solid state nonlinear optical elements
Brian R. Kimball, Kenneth Altshuler, Samuel H. Cohen, Barry S. DeCristofano, Masato Nakashima, Appaji Panchangam, Devulapalli V. G. L. N. Rao, Pengfei Wu
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Proceedings Volume 4462, Nonlinear Optical Transmission Processes and Organic Photorefractive Materials; (2002) https://doi.org/10.1117/12.452741
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States
Abstract
A comparison is made of two, laser-induced-damage assessment techniques. The first technique monitors the sample for changes in linear transmission after high-energy laser illumination. With the second technique, an image is transmitted through the sample, after high-energy laser illumination, at the position of incidence. Both single and multiple shot data are considered. Results show the imaging technique to be an efficient method by which to unambiguously discern the onset of image-degrading laser- damage, regardless of detector noise, shot-to-shot variations and sample inhomogeneities. Practically speaking, the imaging technique is relatively easy to incorporate into a laser-based experimental system and is particularly relevant to the assessment of optical systems for imaging.
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Brian R. Kimball, Kenneth Altshuler, Samuel H. Cohen, Barry S. DeCristofano, Masato Nakashima, Appaji Panchangam, Devulapalli V. G. L. N. Rao, and Pengfei Wu "Evaluation of experimental laser-induced-damage assessment techniques for solid state nonlinear optical elements", Proc. SPIE 4462, Nonlinear Optical Transmission Processes and Organic Photorefractive Materials, (16 January 2002); https://doi.org/10.1117/12.452741
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KEYWORDS
Modulation
Laser damage threshold
Sensors
Laser induced damage
Imaging systems
CCD image sensors
Image resolution
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