Paper
3 March 2003 OLEDs with enhanced high temperature operational stability
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Abstract
Temperature dependence of electroluminescence degradation is studied in organic light emitting devices containing an emitting layer composed of a mixture of different hole transport molecules and tris(8-hydroxyquinoline)aluminum (ALQ3) electron transport and emitter molecule. The emitting layer is sandwiched between hole and electron transport layers. Devices containing the hole transport molecule N,N'-di(naphthalene-1-yl)-N,N'-diphenyl-benzidine (NPB), doped with quinacridone (DMQ) green emitter showed remarkable temperature stability. For these devices, a half-life of about 78,500 hours, 18,700 hours, and 8,600 hours can be projected for operating temperatures of 22°C, 70°C and 100°C, respectively, at an initial device luminance of 100 cd/m2. Activation energies for device degradation were determined for devices with different hole transport molecules and it was found that devices with higher activation energy show better high temperature stability. These results are consistent with the recently proposed degradation mechanism based on the unstable cationic AlQ3 species.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zoran D. Popovic, George Vamvounis, Hany Aziz, and Nan-Xing Hu "OLEDs with enhanced high temperature operational stability", Proc. SPIE 4800, Organic Light-Emitting Materials and Devices VI, (3 March 2003); https://doi.org/10.1117/12.454858
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Cited by 2 scholarly publications.
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KEYWORDS
Organic light emitting diodes

Molecules

Electron transport

Telescopic pixel displays

Ionization

Temperature metrology

Electroluminescence

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