Improvement and application of scanning near-field optical microscope based on a piezoelectric bimorph shear force beam

Tao Chen; Shuo Shi; Jialin Sun; Xiaojing Tan; Guangyan Tian; Yang Cao; Jihua Guo

doi:10.1117/12.481703

5 September 2002 Improvement and application of scanning near-field optical microscope based on a piezoelectric bimorph shear force beam

Tao Chen, Shuo Shi, Jialin Sun, Xiaojing Tan, Guangyan Tian, Yang Cao, Jihua Guo

Author Affiliations +

Proceedings Volume 4923, Nano-Optics and Nano-Structures; (2002) https://doi.org/10.1117/12.481703
Event: Photonics Asia, 2002, Shanghai, China

Abstract

A non-optical shear-force detection method to control the probe-simple distance for a scanning near field optical microscope (SNOM) is proposed. A rectangular piezoelectric bimorph beam is designed so that one piezo layer of the beam is used for vibrating the scanning probe and the other for detecting the vibration. Optical fiber probe is attached on one side ofthe beam to detect the shear force. When the beam is excited at resonance by the stimulation piezo layer, the other detecting layer can generate a maximum piezo voltage. The amplitude ofthe piezo voltage will decrease as the fiber tip gets close to the sample because ofthe shear force interaction experienced by the tip. The oscillating amplitude change, picked up from the detecting piezo layer, severe as feedback and shear force imaging signal. Shear force topographic and optical images of mother disc of compact disk and multicomponent compounds (Rb0 5Cs0.5Ag4I5) thin films have been taken. The results show that the improved system is easy-to-use and fit for study ofvarioi.is thin films.

Citation Download Citation

Tao Chen, Shuo Shi, Jialin Sun, Xiaojing Tan, Guangyan Tian, Yang Cao, and Jihua Guo "Improvement and application of scanning near-field optical microscope based on a piezoelectric bimorph shear force beam", Proc. SPIE 4923, Nano-Optics and Nano-Structures, (5 September 2002); https://doi.org/10.1117/12.481703

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available