Paper
23 July 2003 Infrared and visible ellipsometric studies of cholera toxin in ELISA structures
Daniel W. Thompson, Galen L. Pfeiffer, Emil Berberov, Leon Castro, John A. Woollam
Author Affiliations +
Abstract
Ellipsometry is well known for its extreme sensitivity to the presence and properties of ultra-thin films. In the infrared, resonance response to chemical bonds allows chemical identification in monolayer-thick biological films. In this paper we show results of attachment repeatability for successive layers of monosialoganglioside, cholera toxin, and related antibodies using in situ visible spectroscopic ellipsometry. Several factors contributing to difficulty in obtaining reproducible results are discussed. Soecifically, these include freshness of reagents; surface type, cleaning, and preparation; temperature; birefringence of liquid cell windows; and cell design. Sensitivity and signal noise considerations for infrared spectra of molecular monolayers are discussed.
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Daniel W. Thompson, Galen L. Pfeiffer, Emil Berberov, Leon Castro, and John A. Woollam "Infrared and visible ellipsometric studies of cholera toxin in ELISA structures", Proc. SPIE 4965, Optical Diagnostics and Sensing in Biomedicine III, (23 July 2003); https://doi.org/10.1117/12.479262
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KEYWORDS
Ellipsometry

Infrared radiation

Chemical analysis

Reflection

Silicon

Visible radiation

Absorption

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