Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter

Marcel Flemming; Annette Hultaker; Karsten Reihs; Angela Duparre

doi:10.1117/12.512694

25 February 2004 Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter

Marcel Flemming, Annette Hultaker, Karsten Reihs, Angela Duparre

Author Affiliations +

Proceedings Volume 5250, Advances in Optical Thin Films; (2004) https://doi.org/10.1117/12.512694
Event: Optical Systems Design, 2003, St. Etienne, France

Abstract

We have developed a novel approach to design ultra-hydrophobic surfaces with optical quality. The nanostructure necessary for the functional effect is realized through enhanced nanoroughness of optical thin films. At the same time, the optical appearance must not be disturbed by scattering from the roughness. We have found that through wide-scale roughness analysis, applying white light interferometry, AFM and STM, and subsequent data reduction the roughness characteristics can be directly related to the wetting properties. As, on the other hand, vector scattering theories connect the roughness properties with scatter losses, a formalism has been established, where both the wetting properties and scattering behavior can be expressed within the same "language". Using this tool, the optical thin film design and the surface nanoroughness can be tailored to fulfill demands on wetting properties as well as on sufficient low scatter levels. For the deposition of high index single layers on Borofloat 33 substrates, qualified substrate-film-combinations are predicted by "virtual" coating simulations. Experiments with single oxide layer as test coatings yielded surfaces with a high water contact angle and light scatter losses below defined scatter thresholds.

Citation Download Citation

Marcel Flemming, Annette Hultaker, Karsten Reihs, and Angela Duparre "Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter", Proc. SPIE 5250, Advances in Optical Thin Films, (25 February 2004); https://doi.org/10.1117/12.512694

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available