Laser-micromachined defect arrays for DC potential drop fatigue studies

Craig B. Arnold; Bhanu Pratap; Alberto Pique; Andrew B. Geltmacher; James P. Thomas

doi:10.1117/12.537794

15 July 2004 Laser-micromachined defect arrays for DC potential drop fatigue studies

Craig B. Arnold, Bhanu Pratap, Alberto Pique, Andrew B. Geltmacher, James P. Thomas

Proceedings Volume 5339, Photon Processing in Microelectronics and Photonics III; (2004) https://doi.org/10.1117/12.537794
Event: Lasers and Applications in Science and Engineering, 2004, San Jose, Ca, United States

Abstract

The experimental characterization of fatigue crack initiation and growth of structural materials can be very expensive and time consuming. Fatigue specimens are typically controlled by a single dominant defect and several specimens are needed to examine the fatigue response for each loading condition of interest. Time and expense add up as millions of load cycles are sometimes required to initiate a crack, and replicate tests are necessary to characterize the inherent statistical nature of fatigue. In order to improve the efficiency of experimentation, we are developing laser-based techniques to produce fatigue test samples with arrays of defects. Controlled arrays of oval shaped micro-defects are laser-micromachined in titanium alloy (Ti-6Al-4V). Crack initiation from the individual defects in the arrays is monitored using a DC potential drop technique. Results indicate the utility of this approach in multiplying the amount of fatigue data generated per specimen-test. The new fatigue test approach is applicable to a wide range of material systems and initial defect structures.

Citation Download Citation

Craig B. Arnold, Bhanu Pratap, Alberto Pique, Andrew B. Geltmacher, and James P. Thomas "Laser-micromachined defect arrays for DC potential drop fatigue studies", Proc. SPIE 5339, Photon Processing in Microelectronics and Photonics III, (15 July 2004); https://doi.org/10.1117/12.537794

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