White LED performance

Yimin Gu; Nadarajah Narendran; Jean Paul Freyssinier

doi:10.1117/12.567677

20 October 2004 White LED performance

Yimin Gu, Nadarajah Narendran, Jean Paul Freyssinier

Proceedings Volume 5530, Fourth International Conference on Solid State Lighting; (2004) https://doi.org/10.1117/12.567677
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

Two life tests were conducted to compare the effects of drive current and ambient temperature on the degradation rate of 5 mm and high-flux white LEDs. Tests of 5 mm white LED arrays showed that junction temperature increases produced by drive current had a greater effect on the rate of light output degradation than junction temperature increases from ambient heat. A preliminary test of high-flux white LEDs showed the opposite effect, with junction temperature increases from ambient heat leading to a faster depreciation. However, a second life test is necessary to verify this finding. The dissimilarity in temperature effect among 5 mm and high-flux LEDs is likely caused by packaging differences between the two device types.

Citation Download Citation

Yimin Gu, Nadarajah Narendran, and Jean Paul Freyssinier "White LED performance", Proc. SPIE 5530, Fourth International Conference on Solid State Lighting, (20 October 2004); https://doi.org/10.1117/12.567677

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