Electron microscopy investigation of pulsed-laser deposited hydroxylapatite thin films

J. Werckmann; Monica Iliescu; V. Nelea; J. Faerber; Ion N. Mihailescu

doi:10.1117/12.582802

21 October 2004 Electron microscopy investigation of pulsed-laser deposited hydroxylapatite thin films

J. Werckmann, Monica Iliescu, V. Nelea, J. Faerber, Ion N. Mihailescu

Proceedings Volume 5581, ROMOPTO 2003: Seventh Conference on Optics; (2004) https://doi.org/10.1117/12.582802
Event: ROMOPTO 2003: Seventh Conference on Optics, 2003, Constanta, Romania

Abstract

Hydroxylapatite layers were grown by pulsed laser deposition on a titanium nitride buffer deposited on silicon or a titanium alloy. Usually the layers are deposited in the presence of water vapors or in oxygen with partial pressures of several mbar. In this study depositions were carried out in vacuum of about 10^-5 Torr in order to preserve the memory of the physicochemical state of the expelled material from the target under laser beam impact. This enabled us to study the morphology, the structure and the composition of deposited material by various investigation techniques (XRD, TEM, XPS, SEM). We observed that the deposition is made essentially of hydroxylapatite that have two well-known morphologies: (1) an homogeneous film made of grains of nanometric size without chemical interaction between them and which form a not very dense film; (2) particulates (droplets) where are ejected in solid, pasty or liquid state, accredited by characteristic morphologies and which have complex structures whose origins are the physicochemical transformation and decomposition of hydroxyplapatite during laser beam-target interaction. The physical conditions to obtain a continuous and dense hydroxylapatite film are discussed.

Citation Download Citation

J. Werckmann, Monica Iliescu, V. Nelea, J. Faerber, and Ion N. Mihailescu "Electron microscopy investigation of pulsed-laser deposited hydroxylapatite thin films", Proc. SPIE 5581, ROMOPTO 2003: Seventh Conference on Optics, (21 October 2004); https://doi.org/10.1117/12.582802

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