Paper
18 August 2005 Development of a two-dimensional nano-displacement measuring system utilizing a combined optical and x-ray interferometer
Jinwon Park, Jaegeun Jo, Sangho Byun, Cheon Il Eom
Author Affiliations +
Abstract
We have developed a two-dimensional nano-displacement measuring system utilizing a combined optical and x-ray interferometer (COXI). The system consists of optical interferometers for two-dimensional displacements and an x-ray interferometer. The x-ray interferometer was used to calibrate the non-linearity of the optical interferometers. The x-ray interferometer can subdivide the optical interference signal with 0.2 nm linear scales. The measured non-linearity of the heterodyne optical interferometer was less than 2 nm. The calibrated optical interferometers were used to measure two dimensional nanoscale displacements, and the accuracy of the optical interferometers was reduced to sub-nanometer after the compensation. To demonstrate the application of the system, we have measured the non-linearity of capacitive sensors using the calibrated optical interferometers.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jinwon Park, Jaegeun Jo, Sangho Byun, and Cheon Il Eom "Development of a two-dimensional nano-displacement measuring system utilizing a combined optical and x-ray interferometer", Proc. SPIE 5879, Recent Developments in Traceable Dimensional Measurements III, 587912 (18 August 2005); https://doi.org/10.1117/12.619174
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometers

X-rays

X-ray optics

Calibration

Optical calibration

Sensors

Nonlinear optics

Back to Top